• Frequency characterization of a 2.4 GHz CMOS LNA by Thermal Measurements 

      Mateo Peña, Diego; Altet Sanahujes, Josep; Aldrete Vidrio, Héctor; González Jiménez, José Luis (Institute of Electrical and Electronics Engineers (IEEE), 2006)
      Text en actes de congrés
      Accés obert
      This paper presents a technique to obtain electrical characteristics of analog and RF circuits, based on measuring temperature at the silicon surface close to the circuit under test. Experimental results validate the ...
    • Non-invasive RF built-in testing using on-chip temperature sensors 

      Aldrete Vidrio, Héctor; Onabajo, M.; Altet Sanahujes, Josep; Mateo Peña, Diego; Silva-Martínez, José (IEEE Computer Society Publications, 2009-11)
      Altres
      Accés obert
      This poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors.
    • Review of temperature sensors as monitors for RFMMW built-in testing and self-calibration schemes 

      Altet Sanahujes, Josep; Aldrete Vidrio, Héctor; Reverter Cubarsí, Ferran; Gómez Salinas, Dídac; Gonzalez Jimenez, J. L.; Onabajo, Marvin; Silva Martinez, Jose; Martineau, B.; Perpiñà Gilabet, Xavier; Abdallah, Louay; Stratigopoulos, Haralampos-G.; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Dilhaire, Stefan; Mir, Salvador; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2014)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      This paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. ...
    • Thermal coupling in ICs: aplications to the test and characterization of analogue and RF circuits 

      Altet Sanahujes, Josep; Mateo Peña, Diego; Aldrete Vidrio, Héctor (2010)
      Text en actes de congrés
      Accés obert
      In this presentation we cover how to use low frequency or DC temperature measurements to observe figures of merit of high frequency analogue circuits.
    • Using temperature as observable of the frequency response of RF CMOS amplifiers 

      Aldrete Vidrio, Héctor; Slhi, M A; Altet Sanahujes, Josep; Gruby, S; Mateo Peña, Diego; Michel, H; Clerjaud, L; Rampnous, J M; Rubio Sola, Jose Antonio; Claeys, Wilfrid; Dilhaire, W Claeys I S (Institute of Electrical and Electronics Engineers (IEEE), 2008)
      Text en actes de congrés
      Accés obert
      The power dissipated by the devices of an integrated circuit can be considered a signature of the circuit's performance. Without disturbing the circuit operation, this power consumption can be monitored by temperature ...