Exploració per autor "Suñé, Víctor"
Ara es mostren els items 1-20 de 33
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A combinatorial method for the evaluation of yield of fault-tolerant systems-on-chip
Suñé, Víctor; Rodríguez Montañés, Rosa; Carrasco, Juan A.; Munteanu, D-P (2003)
Text en actes de congrés
Accés obertIn this paper we develop a combinatorial method for the evaluation of yield of fault-tolerant systems-on-chip. The method assumes that defects are produced according to a model in which defects are lethal and affect given ... -
A comparison of numerical splitting-based methods for Markovian dependability and performability models
Suñé, Víctor; Carrasco, Juan A. (Springer, 1998)
Text en actes de congrés
Accés obertIterative numerical methods are an important ingredient for the solution of continuous time Markov dependability models of fault-tolerant systems. In this paper we make a numerical comparison of several splitting-based ... -
A failure-distance based method to bound the reliability of non-repairable Fault-tolerant systems without the knowledge of minimal cuts
Suñé, Víctor; Carrasco, Juan A. (2000-12-11)
Report de recerca
Accés obertCTMC (continuous-time Markov chains) are a commonly used formalism for modeling fault-tolerant systems. One of the major drawbacks of CTMC is the well-known state-space explosion problem. This work develops and analyzes ... -
A failure-distance dased method to bound the reliability of non-repairable fault-tolerant systems without the knowledge of minimal cuts
Suñé, Víctor; Carrasco, Juan A. (Institute of Electrical and Electronics Engineers (IEEE), 2001-03)
Article
Accés obertCTMC (continuous-time Markov chains) are a commonly used formalism for modeling fault-tolerant systems. One of the major drawbacks of CTMC is the well-known state-space explosion problem. This paper develops and analyzes ... -
A method for the computation of reliability bounds for non-repairable fault-tolerant systems
Suñé, Víctor; Carrasco, Juan A. (1997)
Text en actes de congrés
Accés obertA realistic modeling of fault-tolerant systems requires to take into account phenomena such as the dependence of component failure rates and coverage parameters on the operational configuration of the system, which cannot ... -
A Numerical method for the evaluation of the distribution of cumulative reward till exit of a Subset of transient states of a Markov reward model
Carrasco, Juan A.; Suñé, Víctor (IEEE Computer Society Publications, 2011-09-12)
Article
Accés obertMarkov reward models have interesting modeling applications, particularly those addressing fault-tolerant hardware/software systems. In this paper, we consider a Markov reward model with a reward structure including only ... -
An algorithm to find minimal cuts of coherent fault-trees with event-classes using a decision tree
Carrasco, Juan A.; Suñé, Víctor (Institute of Electrical and Electronics Engineers (IEEE), 1999-03)
Article
Accés obertA new algorithm (CS-MC) for computing the minimal cuts of s-coherent fault trees is presented. Input events of the fault tree are assumed classified into classes, where events of the same class are indistinguishable. This ... -
An ROBDD-based combinatorial method for the evaluation of yield of defect-tolerant systems-on-chip
Carrasco, Juan A.; Suñé, Víctor (2009-02)
Article
Accés obertIn this paper, we develop a combinatorial method for the evaluation of the functional yield of defect-tolerant systems-on chip (SoC). The method assumes that random manufacturing defects are produced according to a model ... -
CIRCUITS ELECTRONICS II (Examen 1r quadrimestre)
Gayà Suñer, Pedro Francisco; Suñé, Víctor (Universitat Politècnica de Catalunya, 2004-09-17)
Examen
Accés restringit a la comunitat UPC -
CIRCUITS ELECTRONICS II (Examen 1r quadrimestre)
Suñé, Víctor (Universitat Politècnica de Catalunya, 2004-09-17)
Examen
Accés restringit a la comunitat UPC -
CIRCUITS ELECTRONICS II (Examen 1r quadrimestre)
Suñé, Víctor (Universitat Politècnica de Catalunya, 2003-11-03)
Examen
Accés restringit a la comunitat UPC -
CIRCUITS ELECTRONICS II (Examen 2n quadrimestre)
Gayà Suñer, Pedro Francisco; Suñé, Víctor (Universitat Politècnica de Catalunya, 2002-03-30)
Examen
Accés restringit a la comunitat UPC -
Combinatorial methods for the evaluation of yield and operational reliability of fault-tolerant systems-on-chip
Carrasco, Juan A.; Suñé, Víctor (2004-02)
Article
Accés obertIn this paper we develop combinatorial methods for the evaluation of yield and operational reliability of fault-tolerant systems-on-chip. The method for yield computation assumes that defects are produced according to a ... -
Comment on "Performability analysis: a new algorithm"
Suñé, Víctor; Carrasco, Juan A.; Nabli, H; Sericola, B (2010-01)
Article
Accés obertThe paper “Performability Analysis: A New Algorithm” describes an algorithm for computing the complementary distribution of the accumulated reward over an interval of time in a homogeneous Markov process. In this comment, ... -
Computing the expected Markov reward rates with stationarity detection and relative error control
Suñé, Víctor (Kluwer Academic Publishers, 2016-03-11)
Article
Accés obertBy combining in a novel way the randomization method with the stationary detection technique, we develop two new algorithms for the computation of the expected reward rates of finite, irreducible Markov reward models, with ... -
Efficient implementations of the randomization method with control of the relative error
Suñé, Víctor; Carrasco, Juan A. (2005-05)
Article
Accés obertRandomization is a well-known numerical method for the transient analysis of continuous-time Markov chains. The main advantages of the method are numerical stability, well-controlled computation error and ability to specify ... -
ELECTRÒNICA ANALÒGICA (Examen 2n quadrimestre)
Castilla Fernández, Miguel; Suñé, Víctor (Universitat Politècnica de Catalunya, 2005-02-08)
Examen
Accés restringit a la comunitat UPC -
ELECTRÒNICA ANALÒGICA (Examen 2n quadrimestre)
Castilla Fernández, Miguel; Suñé, Víctor (Universitat Politècnica de Catalunya, 2005-02-08)
Examen
Accés restringit a la comunitat UPC -
ELECTRÒNICA ANALÒGICA (Examen 2n quadrimestre)
Castilla Fernández, Miguel; Suñé, Víctor (Universitat Politècnica de Catalunya, 2005-02-08)
Examen
Accés restringit a la comunitat UPC -
ELECTRÒNICA ANALÒGICA (Examen 2n quadrimestre)
Castilla Fernández, Miguel; Suñé, Víctor (Universitat Politècnica de Catalunya, 2005-02-08)
Examen
Accés restringit a la comunitat UPC