Exploració per autor "Andrade Miceli, Dennis Michael"

Ara es mostren els items 1-5 de 5

    • A comprehensive compensation technique for process variations and environmental fluctuations in digital integrated circuits 

      Andrade Miceli, Dennis Michael; Calomarde Palomino, Antonio; Rubio Sola, Jose Antonio (IEEE Press. Institute of Electrical and Electronics Engineers, 2010)
      Text en actes de congrés
      Accés obert
      Abstract—Process variability and environmental fluctuations deeply affect the digital circuits performance in many different ways, one of them, the data processing time which may cause error on synchronous digital circuits ...

    • Analysis of delay mismatching of digital circuits caused by common environmental fluctuations 

      Andrade Miceli, Dennis Michael; Calomarde Palomino, Antonio; Rubio Sola, Jose Antonio; Cotofana, Sorin (IEEE, 2011)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Environmental conditions are changing all the time along the chip as a consequence of its own activity, provoking deviations on propagation time in digital circuits. In future technologies, the increment of devices sensitivity ...

    • New redundant logic design concept for high noise and low voltage scenarios 

      García Leyva, Lancelot; Andrade Miceli, Dennis Michael; Gómez Fernández, Sergio; Calomarde Palomino, Antonio; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2011-12)
      Article
      Accés restringit per política de l'editorial
      This paper presents a new redundant logia design concept named Turtle Logic(TL).It is a new probabilistic logic method based on port redundancy and complementary data, oriented toward emerging technologies beyond CMOS, ...

    • Power supply noise and logic error probability 

      Andrade Miceli, Dennis Michael; Martorell Cid, Ferran; Pons Solé, Marc; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2007-08)
      Text en actes de congrés
      Accés obert
      Voltage fluctuations caused by parasitic impedances in the power supply rails of modern ICs are a major concern in nowadays ICs. The voltage fluctuations are spread out to the diverse nodes of the internal sections causing ...

    • Voltage fluctuations in IC power supply distribution 

      Andrade Miceli, Dennis Michael; Martorell Cid, Ferran; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio (2007-11)
      Text en actes de congrés
      Accés obert
      The supply voltage decrease and power consumption increase of modern ICs made the requirements for low voltage fluctuation caused by packaging and on-chip parasitic impedances more difficult to achieve. Most of the research ...