Exploració per autor "Upasani, Gaurang"

Ara es mostren els items 1-5 de 5

    • A case for acoustic wave detectors for soft-errors 

      Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (2016-01-01)
      Article
      Accés restringit per política de l'editorial
      The continuing decrease in dimensions and operating voltage of transistors has increased their sensitivity against radiation phenomena, making soft errors an important challenge in future microprocessors. New techniques ...

    • Avoiding core's DUE & SDC via acoustic wave detectors and tailored error containment and recovery 

      Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2014)
      Text en actes de congrés
      Accés obert
      The trend of downsizing transistors and operating voltage scaling has made the processor chip more sensitive against radiation phenomena making soft errors an important challenge. New reliability techniques for handling ...

    • Framework for economical error recovery in embedded cores 

      Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2014)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      The vulnerability of the current and future processors towards transient errors caused by particle strikes is expected to increase rapidly because of exponential growth rate of on-chip transistors, the lower voltages and ...

    • Reducing DUE-FIT of caches by exploiting acoustic wave detectors for error recovery 

      Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (IEEE Computer Society Publications, 2013)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The exponential increase in the transistor count will drive the per chip fault rate sky high. New techniques for detecting ...

    • Setting an error detection infrastructure with low cost acoustics wave detectors 

      Upasani, Gaurang; Vera Rivera, Francisco Javier; González Colás, Antonio María (IEEE, 2012)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      The continuing decrease in dimensions and operating voltage of transistors has increased their sensitivity against radiation phenomena making soft errors an important challenge in future chip multiprocessors (CMPs). Hence, ...