• Fuse: A technique to anticipate failures due to degradation in ALUs 

    Abella Ferrer, Jaume; Vera Rivera, Francisco Javier; Unsal, Osman Sabri; Ergin, Oguz; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2007)
    Text en actes de congrés
    Accés obert
    This paper proposes the fuse, a technique to anticipate failures due to degradation in any ALU (arithmetic logic unit), and particularly in an adder. The fuse consists of a replica of the weakest transistor in the adder ...
  • Impact of parameter variations on circuits and microarchitecture 

    Unsal, Osman Sabri; Tschanz, James W.; Bowman, Keith; De, Vivek; Vera Rivera, Francisco Javier; González Colás, Antonio María; Ergin, Oguz (2006-12)
    Article
    Accés obert
    Parameter variations, which are increasing along with advances in process technologies, affect both timing and power. Variability must be considered at both the circuit and microarchitectural design levels to keep pace ...
  • Reducing soft errors through operand width aware policies 

    Ergin, Oguz; Unsal, Osman Sabri; Vera Rivera, Francisco Javier; González Colás, Antonio María (2009-09)
    Article
    Accés obert
    Soft errors are an important challenge in contemporary microprocessors. Particle hits on the components of a processor are expected to create an increasing number of transient errors with each new microprocessor generation. ...