Browsing by Author "Dal Bem, Vinicius"
Machado, Lucas; Dal Bem, Vinicius; Moll Echeto, Francisco de Borja; Gómez Fernández, Sergio; Ribas, Renato P.; Reis, André Inacio (IEEE Computer Society Publications, 2013)
Restricted access - publisher's policyThis paper presents a novel yield model for integrated circuits manufacturing, considering lithography printability problems as a source of yield loss. The use of regular layouts can improve the printability of IC layouts, ...
Marranghello, Felipe S.; Dal Bem, Vinicius; Reis, André I.; Ribas, Renato P.; Moll Echeto, Francisco de Borja (2011)
Open AccessThis paper presents an extensive transistor sizing analysis for regular transistor fabrics. Several evaluation methods have been exploited, such as DC simulations, ring oscillators and single-gate open chain structures. ...