• Establishing nanoscale heterogeneity with nanoscale force measurements 

    Chang, Yun-Hsiang, Yun-Hsiang; Olukan, Tuza; Lai, Chia-Yun; Santos, Sergio; Lin, Tze-Yu; Apostoleris, Harry; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2015-08-13)
    Article
    Accés obert
    Establishing the presence or absence of nanoscale compositional heterogeneity with nanoscale resolution is becoming instrumental for the development of many fields of science. Force versus distance measurements and parameters ...
  • Periodicity in bimodal atomic force microscopy 

    Lai, Chia-Yun; Barcons Xixons, Víctor; Santos, Sergio; Chiesa, Matteo (American Institute of Physics (AIP), 2015-07-28)
    Article
    Accés obert
    Periodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship ...
  • Single cycle and transient force measurements in dynamic atomic force microscopy 

    Gadelrab, Karim Raafat; Santos, Sergio; Font Teixidó, Josep; Chiesa, Matteo (2013-11-21)
    Article
    Accés obert
    The monitoring of the deflection of a micro-cantilever, as the end of a sharp probe mounted at its end, i.e. the tip, interacts with a surface, forms the foundation of atomic force microscopy AFM. In a nutshell, developments ...