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  • Testing RF circuits with true non-intrusive built-in sensors 

    Abdallah, Louay; Stratigopoulos, Haralampos-G.; Mir, Salvador; Altet Sanahujes, Josep (IEEE, 2012)
    Conference report
    Restricted access - publisher's policy
    We present a set of sensors that enable a builtin test in RF circuits. The key characteristic of these sensors is that they are non-intrusive, that is, they are not electrically connected to the RF circuit, and, thereby, ...