Ara es mostren els items 11-12 de 12

  • Reliability in the face of variability in nanometer embedded memories 

    Ganapathy, Shrikanth (Universitat Politècnica de Catalunya, 2014-04-28)
    Tesi
    Accés obert
    In this thesis, we have investigated the impact of parametric variations on the behaviour of one performance-critical processor structure - embedded memories. As variations manifest as a spread in power and performance, ...
  • vPROBE: Variation aware post-silicon power/performance binning using embedded 3T1D cells 

    Ganapathy, Shrikanth; Canal Corretger, Ramon; González Colás, Antonio María; Rubio Sola, Jose Antonio (2010-09-05)
    Report de recerca
    Accés obert
    In this paper, we present an on-die post-silicon binning methodology that takes into account the effect of static and dynamic variations and categorizes every processor based on power/performance.The proposed scheme is ...